Last Updated： Aggregation Period:Aug 20, 2025～Sep 16, 2025
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Aug 20, 2025～Sep 16, 2025
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Aug 20, 2025～Sep 16, 2025
This ranking is based on the number of page views on our site.
1～15 item / All 189 items
Small quantity sales and custom orders are also welcome. Please feel free to contact us for contact probes!
A wide variety of sizes available for small quantity sales. Custom manufacturing is also accepted. Electrodes that allow for easy attachment and detachment for various electrical tests. *For more details, please download the PDF or contact us.*
We provide advanced processing technology cultivated through the production of contact probes and various inspection jigs.
Our company is a manufacturer of contact probes used for inspecting various electronic components, as well as inspection fixtures that utilize these probes. The technology required in these fields is at an extremely high level, characterized by "ultra-high precision" and "ultra-fine" specifications. Our technology, which has been refined over many years to meet these demands, has solved various challenges not only in inspection-related areas but also across a wide range of applications. We also offer this technology as a processing contract service. *For more details, please download the PDF or contact us.*
Achieving a pitch of P=0.2mm! Active in environments that require strict non-magnetic properties. Uses materials suitable for lead-free electrodes.
To non-magnetize contact probes, it is essential to review the materials and surfaces, but in practice, that alone is not sufficient for the product to be viable. It is only natural that they should be non-magnetic when measuring non-magnetic devices, but they must also possess performance tailored to the characteristics of the electrodes being inspected. Our company offers a lineup of "non-magnetic probes" that are suitable for lead-free electrodes, provide load control for contact probes, and achieve a pitch of P=0.2mm. [Features] ■ Materials suitable for lead-free electrodes ■ Load control for contact probes ■ Achieves pitch compatibility of P=0.2mm *For more details, please refer to the PDF document or feel free to contact us.
By bringing the tip of the contact probe closer to the outside, the gap between the two points can be minimized without changing the thickness of the pin. Pin pitch between 0.4mm and...
The "Kelvin Probe" has its tip positioned right at the edge of the probe's outer shape. By moving the tip outward, it is possible to minimize the gap between two points without changing the thickness of the pin. This allows for stable contact at a fixed position and the maintenance of load. Special board processing is required for use. Our company offers the fabrication of fixtures that can be installed according to the measuring equipment used by our customers. 【Features】 ■ The tip is positioned right at the edge of the probe's outer shape. ■ It can minimize the gap between two points without changing the thickness of the pin. ■ Stable contact at a fixed position. ■ It can maintain load. *For more details, please refer to the PDF document or feel free to contact us.
Compared to conventional BeCu products, it is equivalent or even superior, so wear resistance is not a concern.
At Seiken, in addition to our approach to surface treatment, we have re-evaluated the materials themselves. Traditionally, we used BeCu (beryllium copper), which required surface treatment. However, we have processed an alloy that excels in solder contact properties, allowing it to be used as is without any surface treatment. Even when cleaning the pin tips, the plating thickness is at most 1-2 micrometers, but since the alloy is used in its solid form, there is no risk of plating peeling that would expose the base material and degrade performance. Additionally, the hardness is comparable to or greater than that of traditional BeCu, so wear resistance is not a concern. This material can also be processed for probes in the P=80 micrometer class. *For more details, please refer to the PDF document or feel free to contact us.*
In semiconductor testing, probe cards and IC sockets are often custom-made. We solve issues that cannot be addressed with standard probe products.
We offer a one-sided movable probe as a standard probe in our catalog. However, when trying to match it to equipment used for electrical testing, it may not meet the specifications. We can suggest existing probes tailored to the products or equipment conditions you wish to test, but if there is no suitable probe available, we can manufacture a custom one. In addition to partially manufacturing new parts based on existing probes, we can also create all parts from scratch. Therefore, if you need a replacement or compatible probe due to the discontinuation of a probe manufactured by another company, we may be able to assist you. *For more details, please refer to the PDF document or feel free to contact us.*
Flexible design and manufacturing according to inspection conditions. Small lots are also acceptable. Comprehensive support from assembly, wiring, to inspection.
Our company designs and manufactures "contact probes, IC sockets, and probe cards" used for semiconductor testing. ☆Contact Probes☆ We can flexibly accommodate not only standard products but also special specifications tailored to testing conditions. ☆Probe Cards and IC Sockets☆ We can provide consistent processing and assembly of resin, allowing us to offer testing fixtures suitable for the inspection target at a low cost. 【Examples of Support】 ◎ Narrow pitch support (manufactured with MIN P=80μ) ◎ High current testing (manufactured for pre-process testing of IGBT devices) ◎ Non-magnetic testing (probes made from non-magnetic materials) ◎ Others: high frequency (10GHz), high heat resistance (below 300℃), etc. 【Product Examples】 <Contact Probes> - Reduces replacement hassle. "Rare metal probes" with excellent durability. - Revised internal structure. "New bias probes" for stable resistance value measurement. <IC Sockets> - Non-magnetic compatible sockets. - High heat resistant sockets. <Probe Cards> - Probe cards compatible with min 80μ pitch. - High current load test probe cards. *For more details, please refer to the materials. Feel free to contact us with any inquiries.*
A specialized manufacturer of contact probes explains! How to use and replace standard probes and both-end probes.
We would like to introduce the usage of the "Contact Probe" that we handle. The "Standard Contact Probe (Single-End Probe)" is basically used in pairs with a socket due to the ease of replacement and wiring. The general method of using a contact probe involves drilling a hole in the resin, embedding a socket (receptacle) in it, and connecting the lead wires for wiring. Finally, the contact probe is inserted into the socket to complete the setup. Additionally, our website also provides information on "How to Use a Double-End Contact Probe" and "Replacing a Double-End Probe." [Content Included] ■ How to Use the Standard Probe ■ How to Use the Double-End Probe ■ Replacing the Double-End Probe *For more details, please refer to the PDF materials or visit our website.
Special inspection socket
From easy-to-handle mini press specifications to space-saving designs, we meet our customers' needs.
Custom order for contact probes
We design and manufacture contact probes tailored to your measurement conditions. With the evolution of electrical products, the requirements for measuring electronic components have become more stringent. We select and design probes that can be used in various situations, such as for high current conduction, use in high and low temperature ranges, and measurement of special materials. For more details, please contact us through our website. http://www.sankei-engineering.com/
Contact Probe CP Series (General Purpose) *Measurement Jigs Can Also Be Manufactured!
【Overview】 This is a contact probe with an external spring design, manufactured as an integrated unit. It is suitable for precision measurements because it can maintain low resistivity. ★ For more details about the series, please contact us or download the materials for review. ★ * We also accept requests for the production of fixtures for electrical measurements. You can request our services even without design drawings or knowledge of electrical measurements! We can handle everything from design, concepts, measurement methods, processing, assembly, to wiring. 【Examples of Measurement Fixtures】 Measurement fixtures for battery testing (cylindrical batteries, box-type batteries, lamicell batteries, button batteries, etc.) / Measurement fixtures for connector testing / Measurement fixtures for automotive component testing, etc.
Contact probe, short stroke type *Measurement jigs can also be manufactured!
【Overview】 This is a contact probe with an external spring design, manufactured as an integrated unit. It is suitable for precision measurements due to its ability to maintain low inherent resistance. ★ For more details about the series, please contact us or download the materials to view them. ★ * We also accept requests for the production of fixtures for electrical measurements. You can request our services even without design drawings or knowledge of electrical measurements! We can handle everything from design, concept, measurement methods, processing, assembly, to wiring. 【Examples of Measurement Fixtures】 Measurement fixtures for battery testing (cylindrical batteries, box-type batteries, lamicell batteries, button batteries, etc.) / Measurement fixtures for connector testing / Measurement fixtures for automotive components, etc.
Contact probe long stroke type *Measurement jig production is also possible!
【Overview】 This is a contact probe with an external spring design, manufactured as an integrated unit. Compared to the general-purpose CP series, it features a longer overall length and stroke. It is effective when there is a distance between the mounting position and the object being measured. ★ For more details about the series, please contact us or download the materials to view them. ★ * We also accept requests for the production of fixtures for electrical measurements. No design drawings or prior knowledge of electrical measurements are required! You can request everything from design, concept, measurement methods, processing, assembly, to wiring as a complete package. 【Examples of Measurement Fixtures】 Measurement fixtures for battery testing (cylindrical batteries, box-type batteries, lamicell batteries, button batteries, etc.) / Measurement fixtures for connector testing / Measurement fixtures for automotive component testing, etc.
Contact Probe Long Stroke Type
【Overview】 This is a contact probe with an external spring, manufactured as an integrated unit. Compared to the general-purpose CP series, it has a longer overall length and stroke. It is effective when there is a distance between the mounting position and the measurement object. ★For more details about the series, please contact us or download the materials to view them★
It will be designed according to the measured current value for high current applications.
We design and manufacture contact probes tailored to your measurement conditions. With the evolution of electrical products, the requirements for measuring electronic components have become more stringent. We select and design probes that can be used in various situations, such as for high current conduction, use in high and low temperature ranges, and measurement of special materials. For more details, please contact us through our website. http://www.sankei-engineering.com/
